IEM10+: BENCHTOP SCANNING ELECTRON MICROSCOPE

  

SEMoscope IEM 10+ Benchtop SEM: is an advanced version of the model IEM 10 Scanning Electron Microscope , it has SE and EDS detectors. It is a useful analytical tool in many areas, from materials science and nanotechnology, to biology and microelectronics.

 

Specifications

  • Magnifcation Up To x 100,000
  • Auto Stage : X, Y, T Axis
  • Click & Move Stage Control
  • Auto Function : Filament Memory, Focus, Contrast, Brightness
  • High Defnition Image : 5120 X 3840 Pixel
  • Thermo EDS Detector: 133 eV at Mn, B(5) ~ U(92)

 

SEMoscope CATALOG

 

Magnifcation x20 ~ x100,000 (Efficient: ~x50,000)
Acc Voltage 1 ~ 30 kV (1kV increments)
Electron Gun Tungsten Filament (W)
Detector SE and EDS Detectors
Stage Auto Stage (X: 35mm,Y: 35mm,T: 0 to 45o )

Manual Stage (Z: 5 to 50mm)

Image Shift :X, Y, R(Rotation)
Operating System Microsoft Windows 7
Dimensions 400(W) x 600(L) x 550(H) mm
Weight 85Kg
  1. 1
    Rapid EDS Analysis

  2. 2
    EDS Analysis with NORAN System 7 Spectral Imaging